The MM-16 is unique in its ability to collect full spectral ellipsometric data (2048 points) at high resolution and calculate the complete 16-element Mueller Matrix in <2 seconds. This allows simple characterization of complex birefringent materials, and also simplifies the investigation of samples exhibiting depolarization effects.
These unique capabilities fulfil the requirements for standard thin film metrology as well as many emerging applications using complex materials and structures in the display, biotechnology, packaging and semiconductor areas.
The MM-16 is controlled from the DeltaPsi2 integrated software package to provide turnkey operation for a wide range of industrial and research applications.
For further information about this press release, you can send an e-mail request by .
